新设备可以在任何环境下实现安全准确的可靠测量

NEWS RELEASE – Aug. 15, 2006 – National Instruments today announced 12 new isolated M and S Series multifunction data acquisition (DAQ) devices. These devices combine the safety of isolation with the high-performance timing, amplification and calibration technologies of existing M Series DAQ devices for increased accuracy. Built-in isolation increases the safety of data acquisition devices and eliminates common problems that can ruin measurement accuracy. The new multifunction devices offer 16-bit accuracy, 250 kS/s sampling rates, ±10 V or ±20 mA analog inputs, ±10 V or 0-20 mA analog outputs and 5 V TTL/CMOS or 24 V digital inputs and outputs.

8月15日消息——美国国家仪器公司今天发布了12款隔离式M系列和S系列的多功能数据采集（DAQ）设备。这些设备结合了隔离安全性以及现有M系列DAQ设备的高性能调速、放大和校准技术，提高了精确度。内置隔离作用提高了数据采集设备的安全性，消除了可以破坏测量精确度的普通问题。新的多功能设备提供了16位的精确度，250 kS/s的取样率，±10 V 或者 ±20 mA的模拟输入，±10 V 或者 0-20 mA的模拟输出，以及5 V TTL/CMOS 或者 24 V的数字输入和输出。

The new isolated M and S Series devices offer channel-to-channel or bank isolation with 1,950 VDC/1,400 Vrms transient withstand for 5 s to a PCI bus, which protects expensive equipment, the user and data from hazardous voltage spikes, transient signals and electrical noise. Isolation works by electrically separating the circuit’s front end, where hazardous voltages can exist, from the rest of the data acquisition system. Isolation is especially important when taking measurements from sensors in the proximity of wall power, large motors, high-voltage switches or other high-voltage lines.

新款隔离式M系列和S系列设备提供了通道至通道或者栅隔离，对一个PCI现场仪器具有5秒的1,950 VDC/1,400 Vrms 瞬时承受力，保护昂贵设备、使用者和数据免受到危险电压尖脉冲、瞬时信号以及电噪的损害。隔离通过从数据采集系统的其它地方将存在危险电压的电路前端电力地分离而起作用。隔离作用在测量靠近墙驱动、大型电机、高压开关或者其它高压线路的传感器时就尤其重要。

Isolated M and S Series devices also reject common-mode voltages and prevent ground loops from forming, eliminating two common problems for data acquisition system users. High common-mode voltages can make it impossible to measure the signal in a non-isolated data acquisition system and can even damage the system. The new isolated M and S Series devices can measure from sensors with the signal plus common-mode voltages of up to 60 V. Ground loops, which occur when there is a difference between the ground voltages of the measurement system and the signal being measured, can result in high currents flowing between the two grounds and can damage equipment and ruin accuracy.

隔离式的M系列和S系列设备还可以抵制普通模式的电压，避免了接地环路的生成，为数据系统使用者排除了两个普遍问题。普通模式高压可以导致不能在一个非隔离式数据采集系统中测量信号，甚至会损坏系统。新型的隔离式M系列和S系列设备可以测量传感器的信号以及高达60V的普通模式电压。因测量系统和所测量的信号之间的地压差异而产生的接地环路可以导致两点间的高电流流动，从而损坏设备和破坏精确度。

Isolated M Series devices integrate seamlessly with the National Instruments LabVIEW graphical development platform, and users can configure the devices using NI measurement and services software.

隔离式M系列设备与国家仪器的LabVIEW 绘图开发平台无缝整合，而且使用者可以利用国家仪器的测量和服务软件配置设备。

About NI Data Acquisition

关于NI数据采集

By integrating commercially available silicon and bus technologies with innovative designs, NI data acquisition (DAQ) products continue to improve measurement speed and accuracy while reducing cost for engineers and scientists. NI data acquisition devices are available on the most widely used buses, including PCI, PXI, PCI Express and USB, and work with the industry’s most popular operating systems such as Windows, Linux and Mac OS X.

通过整合适用于商业的硅技术和现场技术以及创新的设计，NI 数据采集产品继续提高着测量速度和精确度，同时减少工程师和科学家的成本。NI的数据采集设备适用于最广泛的应用现场设备，包括PCI， PXI，PCI Express 和 USB，以及可以工作于例如Windows， Linux 和 Mac OS X 等最流行的操作系统。

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